Author:
Reddy Madhukar K.,Reddy Sudhakar M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
19 articles.
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1. Test of Reconfigurable Modules in Scan Networks;IEEE Transactions on Computers;2018-12-01
2. On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-10
3. Test Strategies for Reconfigurable Scan Networks;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
4. Improving the Detectability of Resistive Open Faults in Scan Cells;2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems;2009-10
5. Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells;2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems;2008-10