Author:
Fey Goerschwin,Drechsler Rolf
Cited by
7 articles.
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1. Next Generation Design For Testability, Debug and Reliability Using Formal Techniques;2022 IEEE International Test Conference (ITC);2022-09
2. Integrated Circuits;Design for Testability, Debug and Reliability;2021
3. Synthesizing robust systems;Acta Informatica;2013-12-05
4. Assessing System Vulnerability Using Formal Verification Techniques;Mathematical and Engineering Methods in Computer Science;2012
5. Towards Robustness Analysis Using PVS;Interactive Theorem Proving;2011