Study of IC aging on ring oscillator physical unclonable functions
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6779216/6783285/06783360.pdf?arnumber=6783360
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
2. A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations;ACM Transactions on Design Automation of Electronic Systems;2023-11-15
3. A Reconfigurable LDO-Assisted Physically Unclonable Function Achieving a Zero-BER With 14% Masking;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-08
4. A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03
5. A BER-Suppressed PUF With an Amplification of Process Mismatch Effect in an Oscillator Collapse Topology;IEEE Journal of Solid-State Circuits;2022-07
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