A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations

Abstract

The physical unclonable function (PUF) is a hardware security primitive that can be used to prevent malicious attacks aimed at obtaining device information at the hardware level. The ring oscillator (RO) PUF has attracted considerable research attention. To improve the reliability of the RO PUF under voltage and temperature changes, the response of the duty-cycle (DC) PUF was obtained by comparing the duty cycle of the RO rather than the period. However, this method reduces the effective utilization of process variations, which limits its implementation in mature advanced manufacturing processes. In this study, a splitting duty-cycle (SDC) PUF was proposed to balance the effective extraction of process variations and robustness under voltage and temperature changes. The sensibility formula between the performance of SDC PUF and process, voltage, and temperature was established through a circuit model and statistical methodology, and the comprehensive characteristics of SDC PUF were analyzed theoretically. Next, 16 SDC PUFs with 128-bit responses were implemented and measured on a Xilinx Virtex-7 device. The experimental results revealed that the average native reliability of SDC PUF was 98.97%, and the reliability was 97.32% under various voltage and temperature conditions. This result revealed advantages over the DC PUF implemented in the same device. The uniqueness of the SDC PUF was 50.42%, and it passed the NIST SP 800-22 randomness and autocorrelation function tests.