A 0.66erms− Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique-Reference-Cited by-同舟云学术

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A 0.66erms− Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique

Published:2018-02 Issue:2 Volume:53 Page:527-537
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Yeh Shang-Fu^ORCID,Chou Kuo-Yu,Tu Hon-Yih,Chao Calvin Yi-Ping^ORCID,Hsueh Fu-Lung

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/8271882/08103930.pdf?arnumber=8103930

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A self-adaptive correlated multiple sampling technique based on single-slope ADC for low-noise CMOS image sensors;Microelectronics Journal;2024-07

2. Low-noise Image Sensors with Shifted Pseudo-correlated Multiple Sampling Method;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19

3. An Indirect Time-of-Flight Sensor with Adaptive Multiple Sampling for High Depth Precision;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19

4. A Self-Adaptive Correlated Multiple Sampling Technique Based on Single-Slope Adc for Low-Noise Cmos Image Sensors;2024

5. 用于微光CMOS图像传感器的相关多采样技术;Laser & Optoelectronics Progress;2023

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