A new measurement method for secondary electron yield based on SEM platform
Author:
Affiliation:
1. China Academy of Space Technology(Xi'an),National Key Laboratory of Science and Technology on Space Microwave,Xi'an,China
Funder
CASC
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10156868/10156872/10157449.pdf?arnumber=10157449
Reference9 articles.
1. Time evolution of secondary electron emission and trapped charge accumulation in polyimide film under various primary electron irradiation currents
2. Experimental study on secondary electron emission characteristics of Cu
3. Lab-built test-stand for secondary electron emission of metals in ultra-high vacuum;zhang;Journal of Vacuum Science and Technology,2014
4. Characterisation of charging kinetics of dielectrics under continuous electron irradiation through real time electron emission collecting method
5. Design of a mechatronic system for accurate measurement of secondary electron emission;bašovi?;Measurement,2019
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