Characterisation of charging kinetics of dielectrics under continuous electron irradiation through real time electron emission collecting method

Author:

Guerch Kévin,Paulmier Thierry,Guillemet-Fritsch Sophie,Lenormand Pascal

Funder

THALES

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Characterization of charge carrier lateral conduction in irradiated dielectric materials;Hanna;J. Phys. Appl. Phys.,2011

2. Charging and discharging of electron beam resist films;Bai;J. Vac. Sci. Technol. B,1999

3. J. Hodges, J. Hayes, J.R. Dennison, R. Hoffmann, Measurement of charging and discharging of high resistivity spacecraft materials by electron beams, in: 47th AIAA Aerospace Sciences Meeting including The New Horizons Forum and Aerospace Exposition, American Institute of Aeronautics and Astronautics.

4. Secondary electron emission in the scanning electron microscope;Seiler;J. Appl. Phys.,1983

5. Detector strategy for secondary and backscattered electrons using multiple detector systems;Reimer;Scanning,1985

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