Investigation of Local Ferroelectric Properties of Ultrathin Ferroelectric Films with Scanning Tunneling Microscopy
Author:
Affiliation:
1. Saint Petersburg Electrotechnical University “LETI”,Department of Micro- and Nanoelectronics,Saint Petersburg,Russia
2. Saint Petersburg State University,Saint Petersburg,Russia
Funder
Russian Science Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9950734/9950738/09950820.pdf?arnumber=9950820
Reference11 articles.
1. Local Electric Property Modification of Ferroelectric Tunnel Junctions Induced by Variation of Polarization Charge Screening Conditions under Measurement with Scanning Probe Techniques
2. Structure-resistive property relationships in thin ferroelectric BaTiO$$_{3}$$ films
3. A physics-based compact model of ferroelectric tunnel junction for memory and logic design
4. Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects
5. Tungsten Oxide Single Crystal Nanosheets for Enhanced Multichannel Solar Light Harvesting
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