Author:
Matsunaga J.,Momose H.,Iizuka H.,Kohyama S.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. FT Models;Resilient computer system design;2015
2. Hot-Carrier Effects;VLSI Electronics Microstructure Science;1989
3. Substrate Current Model;Mosfet Modeling & BSIM3 User’s Guide