A Lightweight Model for Detecting Overlapping Anomalies in Steel Sections Based on YOLOv5
Author:
Affiliation:
1. School of Electrical and Information Engineering, Anhui University of Technology,Ma'anshan,Anhui,China,243032
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10548022/10548040/10549626.pdf?arnumber=10549626
Reference15 articles.
1. Defect Detection Method of PCB Based on Improved YOLOv5
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5. Image Manipulation Detection Using the Attention Mechanism and Faster R-CNN[J];Tan;IAENG International Journal of Computer Science,2023
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