A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images
Author:
Affiliation:
1. Arizona State University,Tempe,AZ,USA
2. TechInsights Inc.,Ottawa,ON,Canada
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9897158/9897159/09897544.pdf?arnumber=9897544
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