TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images-Reference-Cited by-同舟云学术

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TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images

Published:2024-03 Issue: Volume:95 Page:102111
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Xiao Wei^ORCID,Zhao Fazhan,Zhao Kun,Ma Hongtu,Li Qing

Funder

National Key Research and Development Program of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference45 articles.

1. High-voltage integrated circuits: history, state of the art, and future prospects;Disney;IEEE Trans. Electron. Dev.,2017

2. Three-dimensional integrated circuits;Topol;IBM J. Res. Dev.,2006

3. Global technology sourcing in china’s integrated circuit design industry: a conceptual framework and preliminary findings;Ernst;East-West Center Working Paper,2012

4. Workflow design and management for IC supply chain;Chen,2009

5. CAPTIVE: Constrained Adversarial Perturbations to Thwart IC Reverse Engineering;Zargari;arXiv preprint arXiv:2110.11459,2021

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Denoising model for scanning electron microscope images of integrated circuits based on denoising diffusion probabilistic models;Journal of Micro/Nanopatterning, Materials, and Metrology;2024-07-05

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