Silent Data Corruptions: Microarchitectural Perspectives
Author:
Affiliation:
1. Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Athina, Greece
Funder
European Union's Horizon Europe research and innovation programme
Meta and Intel
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Link
http://xplorestaging.ieee.org/ielx7/12/10274758/10151692.pdf?arnumber=10151692
Reference45 articles.
1. Revisiting Memory Errors in Large-Scale Production Data Centers: Analysis and Modeling of New Trends from the Field
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3. Multi-Bit Upsets Vulnerability Analysis of Modern Microprocessors
4. Soft Error Effects on Arm Microprocessors: Early Estimations vs. Chip Measurements
5. nZDC
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2. Impact of Voltage Scaling on Soft Errors Susceptibility of Multicore Server CPUs;56th Annual IEEE/ACM International Symposium on Microarchitecture;2023-10-28
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4. Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures;2023 IEEE International Test Conference (ITC);2023-10-07
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