Junctionless Multiple-Gate (JLMG) MOSFETs: A Unified Subthreshold Current Model to Assess Noise Margin of Subthreshold Logic Gate
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9546692/09528833.pdf?arnumber=9528833
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