Multi-probe Two-Dimensional Mapping of Off-State Degradation in DeNMOS Transistors: How and Why Interface Damage Predicts Gate Dielectric Breakdown-Reference-Cited by-同舟云学术

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Multi-probe Two-Dimensional Mapping of Off-State Degradation in DeNMOS Transistors: How and Why Interface Damage Predicts Gate Dielectric Breakdown

Published:2007-12 Issue: Volume: Page:
ISSN:
Container-title:2007 IEEE International Electron Devices Meeting
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Author:

Varghese D.,Kufluoglu H.,Reddy V.,Shichijo H.,Mosher D.,Krishnan S.,Alam M. A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4418847/4418848/04418985.pdf?arnumber=4418985

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