Author:
Grasser T.,Reisinger H.,Goes W.,Aichinger Th.,Hehenberger Ph.,Wagner P.-J.,Nelhiebel M.,Franco J.,Kaczer B.
Cited by
28 articles.
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1. A strong physical unclonable function with machine learning immunity for Internet of Things application;Science China Information Sciences;2023-12-18
2. A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
3. Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
4. A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation;2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2022-06-12
5. High-level design of a novel PUF based on RTN;2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2022-06-12