Impact of SOI, Si<inf>1-x</inf>Ge<inf>x</inf>OI and GeOI substrates on CMOS compatible Tunnel FET performance-Reference-Cited by-同舟云学术

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Impact of SOI, Si1-xGexOI and GeOI substrates on CMOS compatible Tunnel FET performance

Published:2008-12 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE International Electron Devices Meeting
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Author:

Mayer F.,Le Royer C.,Damlencourt J.-F.,Romanjek K.,Andrieu F.,Tabone C.,Previtali B.,Deleonibus S.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4786613/4796592/04796641.pdf?arnumber=4796641

Cited by 76 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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