BIT Index Analysis Approach for Aerospace Products Considering the Whole Mission Phases-Reference-Cited by-同舟云学术

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BIT Index Analysis Approach for Aerospace Products Considering the Whole Mission Phases

Published:2024-01-13 Issue: Volume:31 Page:140-144
ISSN:
Container-title:2024 International Conference on Electronic Engineering and Information Systems (EEISS)
language:
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Author:

Niu Jianchao¹,Sun Mingming²,Wu Dong³

Affiliation:

1. China Electronic Product Relibility and Environmental Testing Research Institute,Guangdong Provincal Key Laboratory of Intelligent Unmanned Systems for Reliability and Digital Verification,Guangzhou,China

2. China Electronic Product Relibility and Environmental Testing Research Institute,The Ministry of Industry and Information Technology Key Laboratory of Quality and Reliability Engineering Technology of Civil Aircraft and Aero-Engine,Guangzhou,China

3. China Electronic Product Relibility and Environmental Testing Research Institute,Guangzhou,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10606969/10607399/10607447.pdf?arnumber=10607447

Reference9 articles.

1. System testability modeling and analysis based on device level failure mode effect and criticality analysis

2. A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function

3. A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function

4. Determination Method of Armored Equipment Testability Index Based on Comprehensive Factors;si-jie;Journal of Academy of Armored Force Engineering( in Chinese),2017

5. Method of Testability Index Determination Based on Generalized Stochastic Petri Net

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