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A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function

  • Published:2016-04 Issue:4 Volume:46 Page:524-534
  • ISSN:2168-2216
  • Container-title:IEEE Transactions on Systems, Man, and Cybernetics: Systems
  • language:
  • Short-container-title:IEEE Trans. Syst. Man Cybern, Syst.

Author:

Zhao Chenxu,Pattipati Krishna R.,Liu Guanjun,Qiu Jing,Lv Kehong,Li Tianmei

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Human-Computer Interaction,Control and Systems Engineering,Software

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4. A unified in-time correction-based testability growth model and its application on test planning;Proceedings of the Institution of Mechanical Engineers, Part G: Journal of Aerospace Engineering;2022-06-22

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