Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
12 articles.
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1. A Hybrid Test Scheme for Automotive IC in Multisite Testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
2. New scan compression approach to reduce the test data volume;IET Computers & Digital Techniques;2021-03-18
3. Functional Broadside Tests Under Broadcast Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing;IEEE Transactions on Semiconductor Manufacturing;2020-08
5. Low Cost Test Pattern Generation in Scan-Based BIST Schemes;Electronics;2019-03-12