A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach-Reference-Cited by-同舟云学术

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A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach

Published:2019-03 Issue:3 Volume:38 Page:439-452
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Gebregiorgis Anteneh^ORCID,Bishnoi Rajendra^ORCID,Tahoori Mehdi B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/8643655/08323214.pdf?arnumber=8323214

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4. A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-05

5. Reliability Analysis and Mitigation of Near-Threshold Voltage (NTC) Caches;Dependable Embedded Systems;2020-12-10

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