Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits-Reference-Cited by-同舟云学术

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Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits

Published:2014-05 Issue:5 Volume:33 Page:691-703
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Mounir Mahmoud Mohamed,Soin Norhayati,Fahmy Hossam A. H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/6800047/06800159.pdf?arnumber=6800159

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development and Challenges of Reliability Modeling From Transistors to Circuits;IEEE Journal of the Electron Devices Society;2023

2. Joint Effects of Aging and Process Variations on Soft Error Rate of Nano-Scale Digital Circuits;Journal of Circuits, Systems and Computers;2020-07-21

3. Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance;IFIP Advances in Information and Communication Technology;2020

4. An NBTI-Aware Digital Low-Dropout Regulator with Adaptive Gain Scaling Control;2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC);2019-10

5. Exploiting Algorithmic Noise Tolerance for Scalable On-Chip Voltage Regulation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-01

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