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PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability/Energy Analysis Method

  • Published:2014-11 Issue:11 Volume:33 Page:1644-1656
  • ISSN:0278-0070
  • Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • language:
  • Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Wen Wujie,Zhang Yaojun,Chen Yiran,Wang Yu,Xie Yuan

Funder

NSF

49th Design Automation Conference A. R. Newton Scholarship

Samsung Global MRAM Innovation Program

NSF of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Timing Optimization Model and PVT Tracked Scheme for STT-MRAM Voltage-Mode Sense;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-09

2. Quantized Magnetic Domain Wall Synapse for Efficient Deep Neural Networks;IEEE Transactions on Neural Networks and Learning Systems;2024

3. Enhancing the lifetime of STT-RAM using compression based wear leveling technique;Microelectronics Reliability;2023-04

4. A Novel High Performance and Energy Efficient NUCA Architecture for STT-MRAM LLCs With Thermal Consideration;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-04

5. A Temperature-Aware Reliability Enhancement Strategy for 3-D Charge-Trap Flash Memory;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02
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