Funder
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
9 articles.
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1. Functional Compaction for Functional Test Sequences;IEEE Access;2024
2. Test Sequences for Faults in the Scan Logic;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
3. Globally Functional Transparent-Scan Sequences;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. Novel algorithms for sequential fault diagnosis based on greedy method;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2020-05-02
5. Novel solution for sequential fault diagnosis based on a growing algorithm;Reliability Engineering & System Safety;2019-12