Author:
Wang Sen,Yan Shijia,Shen Qiang,Luo Cong,Ai Juan,Li Lei,Wang Desheng,Ding Shenglan,Xia Qing
Cited by
3 articles.
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2. Automatic Fault Detection in Soldering Process During Semiconductor Encapsulation;Informatics in Control, Automation and Robotics;2023
3. DeepWafer: A Generative Wafermap Model with Deep Adversarial Networks;2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA);2022-12