Automotive 130 nm smart-power-technology including embedded flash functionality

Author:

Rudolf Ralf,Wagner Cajetan,O'Riain Lincoln,Gebhardt Karl-Heinz,Kuhn-Heinrich Barbara,von Ehrenwall Birgit,von Ehrenwall Andreas,Strasser Marc,Stecher Matthias,Glaser Ulrich,Aresu Stefano,Kuepper Paul,Mayerhofer Alevtina

Publisher

IEEE

Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02

2. Inverted SOA and Transient Non-Linearity of LDMOS Devices With RESURF-Implant;2022 IEEE International Conference on Emerging Electronics (ICEE);2022-12-11

3. BCD Process Technologies;Springer Handbook of Semiconductor Devices;2022-11-11

4. Test Structure Design for Defect Detection during Active Thermal Cycling;Sensors;2022-09-23

5. Non Volatile Memory in Advanced Smart Power technology: product requirements and integration solutions;2022 IEEE International Memory Workshop (IMW);2022-05

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