High performance Pch-LDMOS transistors in wide range voltage from 35V to 200V SOI LDMOS platform technology-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

High performance Pch-LDMOS transistors in wide range voltage from 35V to 200V SOI LDMOS platform technology

Published:2011-05 Issue: Volume: Page:
ISSN:
Container-title:2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs
language:
Short-container-title:

Author:

Shimamoto Satoshi,Yanagida Yohei,Shirakawa Shinji,Miyakoshi Kenji,Imai Toshinori,Oshima Takayuki,Sakano Junichi,Wada Shinichiro

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5871956/5890767/05890786.pdf?arnumber=5890786

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel trench type complementary LIGBTs with common double drift layers for simple process and improvement in switching characteristics;2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2023-03-07

2. Novel trench type complementary LIGBTs with common double drift layers for simple process and improvement in switching characteristics;2023

3. Investigation on Total-Ionizing-Dose Radiation Response for 700 V Double-RESURF SOI LDMOS;IEEE Transactions on Nuclear Science;2022-05

4. Total-Ionizing-Dose Radiation-Induced Dual-Channel Leakage Current at Unclosed Edge Termination for High Voltage SOI LDMOS;IEEE Transactions on Electron Devices;2021-06

5. Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS;IEEE Electron Device Letters;2019-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP