Dual Use Circuitry for Early Failure Warning and Test-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Dual Use Circuitry for Early Failure Warning and Test

Published:2024-04-03 Issue: Volume: Page:1-8
ISSN:
Container-title:2024 25th International Symposium on Quality Electronic Design (ISQED)
language:
Short-container-title:

Author:

Coyle Alexander¹,Jiang Hui²,Dworak Jennifer²,Manikas Theodore¹,Nepal Kundan³

Affiliation:

1. Southern Methodist University,Department of Computer Science,Dallas,Texas,75205

2. Southern Methodist University,Department of Electrical and Computer Engineering,Dallas,Texas,75205

3. University of St. Thomas,Electrical and Computer Engineering Department,Saint Paul,Minnesota,55105

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10528356/10528364/10528709.pdf?arnumber=10528709

Reference25 articles.

1. Test Time and Area Optimized BrST Scheme for Automotive ICs

2. Embedded Deterministic Test

3. Test-per-clock testing of the circuits with scan

4. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

5. Application of Voter Insertion Algorithm for Fault Management using Triple Modular Redundancy (TMR) Technique

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP