Application of Machine Learning Techniques for Amplitude and Phase Noise Characterization-Reference-Cited by-同舟云学术

Application of Machine Learning Techniques for Amplitude and Phase Noise Characterization

Published:2015-04-01 Issue:7 Volume:33 Page:1333-1343
ISSN:0733-8724
Container-title:Journal of Lightwave Technology
language:
Short-container-title:J. Lightwave Technol.

Author:

Zibar Darko,Gonzalez Neil G.,de Oliveira Julio Cesar R. F.,Monroy Idelfonso Tafur,de Carvalho Luis Henrique Hecker,Piels Molly,Doberstein Andy,Diniz Julio,Nebendahl Bernd,Franciscangelis Carolina,Estaran Jose,Haisch Hansjoerg

Funder

Det Frie Forskningsråd

CORESON and Villum Foundation Young Investigator

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx7/50/7054609/07017531.pdf?arnumber=7017531

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