Author:
Yoshimura Masayoshi,Takeuchi Yuki,Yamazaki Hiroshi,Hosokawa Toshinori
Cited by
2 articles.
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1. An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23