Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*-Reference-Cited by-同舟云学术

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Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*

Published:2021-05-24 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE European Test Symposium (ETS)
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Author:

Bosio Alberto,O'Connor Ian,Traiola Marcello,Echavarria Jorge,Teich Jurgen,Hanif Muhammad Abdullah,Shafique Muhammad,Hamdioui Said,Deveautour Bastien,Girard Patrick,Virazel Arnaud,Bertels Koen

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9465371/9465372/09465409.pdf?arnumber=9465409

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03

2. A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks;ACM Computing Surveys;2024-01-22

3. DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment;2023 IEEE European Test Symposium (ETS);2023-05-22

4. Special Session: Approximation and Fault Resiliency of DNN Accelerators;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

5. A Low-Cost Error-Tolerant Flip-Flop Against SET and SEU for Dependable Designs;IEEE Transactions on Circuits and Systems I: Regular Papers;2022-07

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