SEU resistance in advanced SOI-SRAMs fabricated by commercial technology using a rad-hard circuit design-Reference-Cited by-同舟云学术

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SEU resistance in advanced SOI-SRAMs fabricated by commercial technology using a rad-hard circuit design

Published:2002-12 Issue:6 Volume:49 Page:2965-2968
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Hirose K.¹,Saito H.¹,Kuroda Y.,Ishii S.,Fukuoka Y.,Takahashi D.

Affiliation:

1. Inst. of Space & Astron. Sci., Kanagawa, Japan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/25186/01134247.pdf?arnumber=1134247

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