Impact of passivation layers on enhanced low-dose-rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar linear ICs-Reference-Cited by-同舟云学术

Impact of passivation layers on enhanced low-dose-rate sensitivity and pre-irradiation elevated-temperature stress effects in bipolar linear ICs

Published:2002-12 Issue:6 Volume:49 Page:3171-3179
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Shaneyfelt M.R.¹,Pease R.L.,Schwank J.R.,Maher M.C.,Hash G.L.,Fleetwood D.M.,Dodd P.E.,Reber C.A.,Witczak S.C.,Riewe L.C.,Hjalmarson H.P.,Banks J.C.,Doyle B.L.,Knapp J.A.

Affiliation:

1. Sandia Nat. Labs., Albuquerque, NM, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/25186/01134277.pdf?arnumber=1134277

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