The structure, properties, and dynamics of oxygen vacancies in amorphous SiO/sub 2/-Reference-Cited by-同舟云学术

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The structure, properties, and dynamics of oxygen vacancies in amorphous SiO/sub 2/

Published:2002-12 Issue:6 Volume:49 Page:2667-2673
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Nicklaw C.J.¹,Lu Z.-Y.¹,Fleetwood D.M.¹,Schrimpf R.D.¹,Pantelides S.T.¹

Affiliation:

1. Vanderbilt Univ., Nashville, TN, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/25186/01134202.pdf?arnumber=1134202

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