Layout-Dependent Vertical and In-Plane Leakage Current Reduction of Organic Thin-Film Transistors by Layer Contact Restriction

Author:

Oshima Kunihiro1,Kuribara Kazunori2,Sato Takashi1

Affiliation:

1. Kyoto University,Graduate School of Informatics,Yoshida-hon-machi, Sakyo,Kyoto 606-8501,Japan

2. National Institute of Advanced Industrial Science and Technology (AIST)

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Layout Design for DNTT-Based Organic TFTs Considering Fringe Leakage Current;IEEE Journal on Flexible Electronics;2024-03

2. Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

3. Flex-SNN: Spiking Neural Network on Flexible Substrate;IEEE Sensors Letters;2023-05

4. Aging-robust amplifier composed of p-type low voltage OTFT and organic semiconductor load;Japanese Journal of Applied Physics;2023-02-09

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