Characterization and Monitoring Platform for Single-Photon Avalanche Diodes in the Development of a Photon-to-Digital Converter Technology-Reference-Cited by-同舟云学术

Characterization and Monitoring Platform for Single-Photon Avalanche Diodes in the Development of a Photon-to-Digital Converter Technology

Published:2022-03-21 Issue: Volume: Page:
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Container-title:2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
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Author:

Parent Samuel¹,Vachon Frederic¹,Gauthier Valerie¹,Paquette Alexandre¹,Deschamps Jacob¹,Rossignol Tommy¹,Arsenault Philippe¹,Paulin Caroline¹,Lemay Joel¹,Roy Nicolas¹,Cote Maxime²,Dupont Denis²,Martel Stephane²,Dautet Henri¹,Charlebois Serge A.¹,Pratte Jean-Francois¹

Affiliation:

1. Université de Sherbrooke,Institut Interdisciplinaire d’Innovation Technologique,Sherbrooke,Canada

2. Teledyne DALSA Semiconductor,Bromont,Canada

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9898143/9898103/09898180.pdf?arnumber=9898180

Reference8 articles.

1. Industrial exploitation of SiPM technology developed for basic research

2. Ketek: Characterization of sipms for large scale applications;engelmann;international Conference on the Advancement of SiliconPhotomultipliers,0

3. High-volume silicon photomultiplier production, performance, and reliability

4. Measuring count rates free from correlated noise in digital silicon photomultipliers

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1. Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes;IEEE Journal of the Electron Devices Society;2024

2. Fast neutron radiography-based on single-photon digital photosensor: concept and demonstration;Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV;2023-10-03