Integrated Silicon Photonics OFDR System for High-Resolution Distributed Measurements Based on Rayleigh Backscattering-Reference-Cited by-同舟云学术

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Integrated Silicon Photonics OFDR System for High-Resolution Distributed Measurements Based on Rayleigh Backscattering

Published:2024-05-01 Issue:9 Volume:42 Page:3482-3493
ISSN:0733-8724
Container-title:Journal of Lightwave Technology
language:
Short-container-title:J. Lightwave Technol.

Author:

Han Gaoce¹^ORCID,Guo Zhen²^ORCID,Wang Shumeng¹,Du Han³^ORCID,Marco James²^ORCID,Greenwood David²^ORCID,Yu Yifei⁴,Yan Jize¹

Affiliation:

1. Electronics and Computer Science (ECS), University of Southampton, Southampton, U.K.

2. Warwick Manufacturing Group (WMG), University of Warwick, Coventry, U.K.

3. Zepler Institute for Photonics and Nanoelectronics, University of Southampton, Southampton, U.K.

4. School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, PR China

Funder

High Value Manufacturing Catapult

Engineer and Physical Sciences Research Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/50/10500897/10381767.pdf?arnumber=10381767

Reference14 articles.

1. Integrated Auxiliary Interferometer for Self-Correction of Nonlinear Tuning in Optical Frequency Domain Reflectometry

2. Distributed High Temperature Monitoring of SMF under Electrical Arc Discharges Based on OFDR

3. High Sensing Accuracy Realisation With Millimetre/Sub-Millimetre Resolution in Optical Frequency Domain Reflectometer

4. Distributed transverse-force sensing along a single-mode fiber using polarization-analyzing OFDR: erratum

5. Distributed Pressure Sensing Using an Embedded-Core Capillary Fiber and Optical Frequency Domain Reflectometry

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1. Manufacture of Microstructured Optical Fibers: Problem of Optimal Control of Silica Capillary Drawing Process;Computation;2024-04-23

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