In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique
Author:
Affiliation:
1. Sandia National Laboratories, Albuquerque, NM, USA
2. Electrical Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
https://ieeexplore.ieee.org/ielam/23/10504930/10430126-aam.pdf
Reference47 articles.
1. Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
2. Two-photon laser-assisted device alteration in silicon integrated-circuits
3. A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS
4. Laser measurement techniques for detecting age-related degradation of device radiation response
5. Laser voltage probe (LVP): a novel optical probing technology for flip-chip packaged microprocessors
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