Two-photon laser-assisted device alteration in silicon integrated-circuits-Reference-Cited by-同舟云学术

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Two-photon laser-assisted device alteration in silicon integrated-circuits

Published:2013-11-18 Issue:24 Volume:21 Page:29083
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Serrels Keith A.,Erington Kent,Bodoh Dan,Farrell Carl,Leslie Neel,Lundquist Theodore R.,Vedagarbha Praveen,Reid Derryck T.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference14 articles.

1. Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

2. Octave-spanning super-continuum from a silica photonic crystal fiber pumped by a 386 MHz Yb:fiber laser

3. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

4. Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

5. Backside laser testing of ICs for SET sensitivity evaluation

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1. In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique;IEEE Transactions on Nuclear Science;2024-04

2. LADA and SDL: Powerful Techniques for Marginal Failures;Microelectronics Failure Analysis;2019

3. Time-domain measurements reveal spatial aberrations in a sub-surface two-photon microscope;Applied Optics;2017-06-09

4. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light;Microelectronics Reliability;2016-05

5. Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light;Conference on Lasers and Electro-Optics;2016

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