Heavy-Ion-Induced Displacement Damage Effects on WO<i> <sub>x</sub> </i> ECRAM-Reference-Cited by-同舟云学术

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Heavy-Ion-Induced Displacement Damage Effects on WO _x ECRAM

Published:2024-04 Issue:4 Volume:71 Page:579-584
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Marinella Matthew J.¹^ORCID,Bennett Christopher H.²^ORCID,Zutter Brian³,Siath Max¹,Spear Matthew¹^ORCID,Vizkelethy Gyorgy²^ORCID,Xiao T. Patrick²^ORCID,Fuller Elliot³^ORCID,Hughart David²^ORCID,Agarwal Sapan³^ORCID,Li Yiyang⁴,Talin A. Alec³^ORCID

Affiliation:

1. Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ, USA

2. Sandia National Laboratories, Albuquerque, NM, USA

3. Sandia National Laboratories, Livermore, CA, USA

4. Materials Science Department, University of Michigan, Ann Arbor, MI, USA

Funder

Laboratory-Directed Research and Development (LDRD) Program

National Technology and Engineering Solutions of Sandia, LLC

U.S. Department of Energy

DOE Office of Science Research Program for Microelectronics Codesign (sponsored by ASCR, BES, HEP, NP, and FES) through the Abisko Project, PM Robinson Pino

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

https://ieeexplore.ieee.org/ielam/23/10504930/10440185-aam.pdf

Reference20 articles.

1. Li‐Ion Synaptic Transistor for Low Power Analog Computing

2. Dynamics of PSG-Based Nanosecond Protonic Programmable Resistors for Analog Deep Learning

3. Electrochemical Ionic Synapses: Progress and Perspectives

4. Redox transistors for neuromorphic computing

5. Resistive memory device requirements for a neural algorithm accelerator

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