Sub-pixel Edge Detection in Diameter Measurement for Single Silicon Crystal
Author:
Affiliation:
1. Research Center for Intelligent Robotics, Research Institute of Interdisciplinary Innovation, Zhejiang Lab
2. Yiwu Industrial & Commercial College,Yiwu,China
Funder
NSFC
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10011626/10011636/10011952.pdf?arnumber=10011952
Reference16 articles.
1. A novel method for diameter measurement of silicon single crystal;xuanyin;Measurement,2018
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3. Improvement of the image quality of a high-temperature vision system;anna;Measurement Science and Technology,2009
4. High-temperature strain field measurement using digital image correlation
5. A Comprehensive Analysis of Image Edge Detection Techniques
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