A novel algorithm for testing crosstalk induced delay faults in VLSI circuits

Author:

Aniket ,Arunachalam R.

Publisher

IEEE Computer Soc

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Adaptive Time-Triggered Network-on-Chip Architecture: Enhancing Safety;2023 3rd International Conference on Smart Generation Computing, Communication and Networking (SMART GENCON);2023-12-29

2. Design of Fault-Tolerant and Reliable Networks-on-Chip;2015 IEEE Computer Society Annual Symposium on VLSI;2015-07

3. New Structure of Test Pattern Generator Stimulating Crosstalks in Bus-type Connections;International Journal of Electronics and Telecommunications;2015-03-01

4. A Routing-Level Solution for Fault Detection, Masking, and Tolerance in NoCs;2015 23rd Euromicro International Conference on Parallel, Distributed, and Network-Based Processing;2015-03

5. A fully parallel BIST-based method to test the crosstalk defects on the inter-switch links in NOC;Microelectronics Journal;2013-03

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