A fully parallel BIST-based method to test the crosstalk defects on the inter-switch links in NOC-Reference-Cited by-同舟云学术

A fully parallel BIST-based method to test the crosstalk defects on the inter-switch links in NOC

Published:2013-03 Issue:3 Volume:44 Page:248-257
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Nourmandi-Pour Reza,Mousavian Nafiseh

Publisher

Elsevier BV

Subject

General Engineering

Reference45 articles.

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