Reliable cache design with detection of gate oxide breakdown using BIST
Author:
Ahmed Fahad,Milor Linda
Cited by
3 articles.
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1. Methodology of reliability enhancement for high power LED driver;Microelectronics Reliability;2014-06
2. Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2012-05
3. Overcoming Variations in Nanometer-Scale Technologies;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2011-03