Author:
Pulukuri Mary D.,Stroud Charles E.
Cited by
3 articles.
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1. Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing;2020 23rd Euromicro Conference on Digital System Design (DSD);2020-08
2. On Built-In Self-Test for multipliers;Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon);2010-03
3. On Built-In Self-Test for Adders;Journal of Electronic Testing;2009-09-24