1. Comparison of Techniques for Reducing Leakage Current in SRAM: A Study of Gated VDD, MTCMOS, and Clamping Diode Techniques;2024 International Conference on Recent Advances in Electrical, Electronics, Ubiquitous Communication, and Computational Intelligence (RAEEUCCI);2024-04-17
2. Design and Analysis of RNS based Montgomery multiplier using FinFET Technology;2024 IEEE 9th International Conference for Convergence in Technology (I2CT);2024-04-05
3. Standard Cell Library Design of 2:1 Mux Using 45nm Technology;2023 International Conference on Next Generation Electronics (NEleX);2023-12-14
4. Analysis of High-Performance Near-threshold Dual Mode Logic Design;International Journal of Electronics and Telecommunications;2023-07-26
5. Analysis of Abnormal GIDL Current Degradation Under Hot Carrier Stress in DSOI-MOSFETs;IEEE Transactions on Electron Devices;2022-11