BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits-Reference-Cited by-同舟云学术

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BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits

Published:2007-04 Issue: Volume: Page:
ISSN:
Container-title:2007 Design, Automation & Test in Europe Conference & Exhibition
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Author:

Zjajo Amir,Asian Manuel J. Barragan,de Gyvez Jose Pineda

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4211748/4211749/04211987.pdf?arnumber=4211987

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Novel Built-In Test Equipment for Phase Measurement in Millimeter-Wave Phased Arrays Integrated Circuits With Absolute Phase Measurement Capabilities;IEEE Transactions on Microwave Theory and Techniques;2022-11

3. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

4. Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors;Journal of Electronic Testing;2015-08

5. A procedure for Alternate Test feature design and selection;IEEE Design & Test;2014

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