Author:
Paul B.C.,Kunhyuk Kang ,Kufluoglu H.,Alam M.A.,Roy K.
Cited by
20 articles.
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1. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023
2. Circuit Reliability Analysis with Considerations of Aging Effect;2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2022-08-22
3. Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08
4. Investigation of NBTI Effect in P-Type Junctionless Transistor with Uniform and Graded Doping Profiles;Transactions on Electrical and Electronic Materials;2021-02-17
5. Selective Sensor Placement for Cost-Effective Online Aging Monitoring and Resilience;Proceedings of the 2020 International Symposium on Physical Design;2020-03-20