Investigation of the electron transfer characteristics in multi-δ-doped GaAs FET's-Reference-Cited by-同舟云学术

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Investigation of the electron transfer characteristics in multi-δ-doped GaAs FET's

Published:1996 Issue:8 Volume:43 Page:1181-1186
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Ming-Jer Kao ,Hir-Ming Shieh ,Wei-Chou Hsu ,Tien-Yih Lin ,Yue-Huei Wu ,Rong-Tay Hsu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/11101/00506766.pdf?arnumber=506766

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