5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance-Reference-Cited by-同舟云学术

5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance

Published:2020-02 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE International Solid- State Circuits Conference - (ISSCC)
language:
Short-container-title:

Author:

Sakano Yorito,Toyoshima Takahiro,Nakamura Ryosuke,Asatsuma Tomohiko,Hattori Yuki,Yamanaka Takayuki,Yoshikawa Ryoichi,Kawazu Naoki,Matsuura Tomohiro,Iinuma Takahiro,Toya Takahiro,Watanabe Tomohiko,Suzuki Atsushi,Motohashi Yuichi,Azami Junichiro,Tateshita Yasushi,Haruta Tsutomu

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9046640/9062887/09063095.pdf?arnumber=9063095

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An area‐effective and low‐power single‐slope ADC for DCG imaging CMOS image sensor;International Journal of Circuit Theory and Applications;2024-05-26

2. A 3.36-μm-Pitch SPAD Photon-Counting Image Sensor Using a Clustered Multi-Cycle Clocked Recharging Technique With an Intermediate Most-Significant-Bit Readout;IEEE Journal of Solid-State Circuits;2024-04

3. A 60-Frames/s CMOS Image Sensor With Pixelwise Conversion Gain Modulation and Self-Triggered ADCs for Per-Frame Adaptive DCG-HDR Imaging;IEEE Journal of Solid-State Circuits;2024

4. A high dynamic range pixel using lateral overflow integration capacitor and adaptive feedback structure in CMOS image sensors;Optoelectronics Letters;2023-12

5. A Low-Noise Area-Efficient Column-Parallel ADC With an Input Triplet for a 120-dB High Dynamic Range CMOS Image Sensor;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-12